Modelling and Language Support for the Management of Pattern-Bases

M. Terrovitis, P. Vassiliadis, E. Skiadopoulos, S. Bertino, B. Catania, and A. Maddalena
In Proceedings of the 16th International Conference on Scientific and Statistical Database Management (SSDBM'04), pages 265--274. IEEE Computer Society, 2004

In our days knowledge extraction methods are able to produce artifacts (also called patterns) that concisely rep- resent data. Patterns are usually quite heterogeneous and require ad-hoc processing techniques. So far, little empha- sis has been posed on developing an overall integrated en- vironment for uniformly representing and querying dif- ferent types of patterns. Within the larger context of mod- elling, storing, and querying patterns, in this paper, we: (a) formally de¯ne the logical foundations for the global setting of pattern management through a model that cov- ers data, patterns and their intermediate mappings; (b) present a pattern speci¯cation language for pattern man- agement along with safety restrictions; and (c) intro- duce queries and query operators and identify interest- ing query classes.

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